Ultra sensitive measurement of dielectric current under pulsed stress conditions

نویسندگان

  • Clemens Helfmeier
  • Anne Beyreuther
  • Alexander Fox
  • Christian Boit
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015